As devices are now being manufactured at the nano-scale level, it is important to understand the underlying structures, applications and limitations of the materials involved. Sophisticated techniques have been developed to yield information about these materials, even down to the atomic level.
This course will survey the primary methods for nano-scale structural characterization, such as identity, chemical composition and crystallography. Analysis techniques such as optical microscopy, X-ray diffraction, electron microscopy, microprobe and Auger spectroscopy will all be reviewed. Students will learn principles of image formation and interpretation, resolution, contrast and microchemical analysis.
Please note: this course will be online-only, so no lectures will be recorded on-campus.
- Robert Sinclair Charles M. Pigott Professor, School of Engineering
- Conventional imaging and lens aberrations
- Resolution, contrast limitations and channeling patterns
- Imaging and dual beam capability
- Emission of characteristic radiation and application for microchemical analysis
- Kikuchi diffraction and analysis of lattice defects
- Convergent beam diffraction and energy filtered imaging
Note on Course Availability
The course schedule is displayed for planning purposes – courses can be modified, changed, or cancelled. Course availability will be considered finalized on the first day of open enrollment. For quarterly enrollment dates, please refer to our graduate certificate homepage.